Suehle, John : rechercher sur Z-Library

Campagne de collecte 15 septembre 2024 – 1 octobre 2024 C'est quoi, la collecte de fonds?

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Campagne de collecte 15 septembre 2024 – 1 octobre 2024

Z-Library est une des plus grandes bibliothèques en ligne dans le monde, avec le stockage de plus de 17,000,000 livres et plus de 84,837,000 articles. Nous encourageons l'accès libre de chacun à la littérature. Aujourd'hui (15 septembre 2024) nous faisons un appel de fonds à tous ceux qui veulent contribuer encore plus au soutien et au développement de notre projet.

Les téléchargements SANS LIMITE sont aussi (au cours de 31 jours après la date de don) disponibles pour TOUS les utilisateurs qui soient en mesure de soutenir le projet pendant la période de collecte de fonds jusqu'au 1 octobre 2024.

C'est quoi, la collecte de fonds?En savoir plus

Livres
Articles (54)
Les plus populaires
Liste
- Liste
- Tableau

1

The measurement, use and interpretation of the temperature coefficient of resistance of metallizations

Harry A. Schafft, John S. Suehle

Journal:

Solid-State Electronics

Année:

1992

Langue:

english

Fichier:

PDF, 693 KB

english, 1992

2

Investigation of the intrinsic SiO2 area dependence using TDDB testing and model integration into the design process

James Prendergast, Nigel Foley, John S. Suehle

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 354 KB

english, 1998

3

Reliability Issues of SiC MOSFETs: A Technology for High-Temperature Environments

Yu, Liangchun C., Dunne, Greg T., Matocha, Kevin S., Cheung, Kin P., Suehle, John S., Sheng, Kuang

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.04 MB

english, 2010

4

Characterization of time-dependent dielectric breakdown in intrinsic thin SiO2

John S. Suehle, Prasad Chaparala

Journal:

Microelectronics Journal

Année:

1996

Langue:

english

Fichier:

PDF, 550 KB

english, 1996

5

Techniques and characterization of pulsed electromigration at the wafer-level

John S. Suehle, Harry A. Schafft

Journal:

Microelectronics Reliability

Année:

1992

Langue:

english

Fichier:

PDF, 463 KB

english, 1992

6

Enhanced gate induced drain leakage current in HfO2 MOSFETs

Moshe Gurfinkel, John S. Suehle, Yoram Shapira

Journal:

Microelectronic Engineering

Année:

2009

Langue:

english

Fichier:

PDF, 817 KB

english, 2009

7

Time-Dependent Dielectric Breakdown of 4H-SiC/$ \hbox{SiO}_{2}$ MOS Capacitors

Gurfinkel, Moshe, Horst, Justin C., Suehle, John S., Bernstein, Joseph B., Shapira, Yoram, Matocha, Kevin S., Dunne, Greg, Beaupre, Richard A.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 312 KB

english, 2008

8

The Role of High-Field Stress in the Negative-Bias Temperature Instability

Campbell, J. P., Cheung, Kin P., Suehle, John S., Oates, Anthony S.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 790 KB

english, 2010

9

Correction to Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Nonvolatile Memory Applications

Zhu, Hao, Pookpanratana, Sujitra J., Bonevich, John E., Natoli, Sean N., Hacker, Christina A., Ren, Tong, Suehle, John S., Richter, Curt A., Li, Qiliang

Journal:

ACS Applied Materials & Interfaces

Année:

2016

Langue:

english

Fichier:

PDF, 122 KB

english, 2016

10

An experimental comparison of measurement techniques to extract Si-SiO2 interface trap density

Steven C. Witczak, John S. Suehle, Michael Gaitan

Journal:

Solid-State Electronics

Année:

1992

Langue:

english

Fichier:

PDF, 989 KB

english, 1992

11

The interaction of stoichiometry, mechanical stress, and interface trap density in LPCVD Si-rich SiNx;Si structures

Steven C. Witczak, Michael Gaitan, John S. Suehle, Martin C. Peckerar, David I. Ma

Journal:

Solid-State Electronics

Année:

1994

Langue:

english

Fichier:

PDF, 1.10 MB

english, 1994

12

Reliability of ultra-thin silicon dioxide under substrate hot-electron, substrate hot-hole and tunneling stress

Eric M. Vogel, Monica D. Edelstein, John S. Suehle

Journal:

Microelectronic Engineering

Année:

2001

Langue:

english

Fichier:

PDF, 282 KB

english, 2001

13

Structural, optical and electronic properties of oxidized AIN thin films at different temperatures

Enam Ahmed Chowdhury, M. Dashiell, G. Qiu, J. O. Olowolafe, R. Jonczyk, D. Smith, A. Barnett, J. Kolodzey, K. M. Unruh, C. P. Swann, John Suehle, Yuan Chen

Journal:

Journal of Electronic Materials

Année:

1998

Langue:

english

Fichier:

PDF, 523 KB

english, 1998

14

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Interface Barrier Determination by Internal Photoemission: Applications to Metal/Oxide/Semiconductor Structure

Nguyen, Nhan V., Kirillov, Oleg A., Jiang, Weirong, Maslar, James E., Kimes, William, Suehle, John S.

Année:

2008

Langue:

english

Fichier:

PDF, 299 KB

english, 2008

15

Disease Detection and Management via Single Nanopore-Based Sensors

Reiner, Joseph E., Balijepalli, Arvind, Robertson, Joseph W. F., Campbell, Jason, Suehle, John, Kasianowicz, John J.

Journal:

Chemical Reviews

Année:

2012

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2012

16

[IEEE 2009 67th Annual Device Research Conference (DRC) - University Park, PA, USA (2009.06.22-2009.06.24)] 2009 Device Research Conference - Steep subthreshold slope nanowire FETs with gate-induced Schottky-barrier tunneling

Li, Qiliang, Zhu, Xiaoxiao, Ioannou, Dimitris, Suehle, John, Richter, Curt

Année:

2009

Langue:

english

Fichier:

PDF, 964 KB

english, 2009

17

Fabrication, characterization and simulation of high performance Si nanowire-based non-volatile memory cells

Zhu, Xiaoxiao, Li, Qiliang, Ioannou, Dimitris E, Gu, Diefeng, Bonevich, John E, Baumgart, Helmut, Suehle, John S, Richter, Curt A

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2011

18

Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Li, Qiliang, Koo, Sang-Mo, Richter, Curt A., Edelstein, Monica D., Bonevich, John E., Kopanski, Joseph J., Suehle, John S., Vogel, Eric M.

Journal:

IEEE Transactions on Nanotechnology

Année:

2007

Langue:

english

Fichier:

PDF, 1.55 MB

english, 2007

19

Direct Measurement of Dirac Point Energy at the Graphene/Oxide Interface

Xu, Kun, Zeng, Caifu, Zhang, Qin, Yan, Rusen, Ye, Peide, Wang, Kang, Seabaugh, Alan C., Xing, Huili Grace, Suehle, John S., Richter, Curt A., Gundlach, David J., Nguyen, N. V.

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 2.13 MB

english, 2013

20

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Oxide Reliability of SiC MOS Devices

Yu, Liangchun, Cheung, Kin P., Campbell, Jason, Suehle, John S., Sheng, Kuang

Année:

2008

Langue:

english

Fichier:

PDF, 2.47 MB

english, 2008

21

Low frequency noise characterizations of ZnO nanowire field effect transistors

Wang, Wenyong, Xiong, Hao D., Edelstein, Monica D., Gundlach, David, Suehle, John S., Richter, Curt A., Hong, Woong-Ki, Lee, Takhee

Journal:

Journal of Applied Physics

Année:

2007

Langue:

english

Fichier:

PDF, 847 KB

english, 2007

22

[IEEE 2007 7th IEEE Conference on Nanotechnology (IEEE-NANO) - Hong Kong, China (2007.08.2-2007.08.5)] 2007 7th IEEE Conference on Nanotechnology (IEEE NANO) - Nanowire electromechanical logic switch

Qiliang Li,, Richter, Curt A., Xiong, Hao D., Suehle, John S.

Année:

2007

Langue:

english

Fichier:

PDF, 1.33 MB

english, 2007

23

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

Xiong, Hao D., Dawei Heh,, Shuo Yang,, Xiaoxiao Zhu,, Gurfinkel, Moshe, Bersuker, Gennadi, Ioannou, D.E., Richter, Curt A., Cheung, Kin P., Suehle, John S.

Année:

2008

Langue:

english

Fichier:

PDF, 409 KB

english, 2008

24

Silicon nanowire electromechanical switches for logic device application

Li, Qiliang, Koo, Sang-Mo, Edelstein, Monica D, Suehle, John S, Richter, Curt A

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 515 KB

english, 2007

25

On the Contribution of Bulk Defects on Charge Pumping Current

Ryan, Jason T., Southwick, Richard G., Campbell, Jason P., Cheung, Kin P., Suehle, John S.

Journal:

IEEE Transactions on Electron Devices

Année:

2012

Langue:

english

Fichier:

PDF, 643 KB

english, 2012

26

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - CMOS and Interconnect Reliability - Negative Bias Temperature Instability

Bersuker, Gennadi, Suehle, John

Année:

2007

Langue:

english

Fichier:

PDF, 46 KB

english, 2007

27

Defect generation and breakdown of ultrathin silicon dioxide induced by substrate hot-hole injection

Vogel, Eric M., Edelstein, Monica D., Suehle, John S.

Journal:

Journal of Applied Physics

Année:

2001

Langue:

english

Fichier:

PDF, 339 KB

english, 2001

28

Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation

Suehle, John S., Vogel, Eric M., Roitman, Peter, Conley, John F., Johnston, Allan H., Wang, Bin, Bernstein, Joseph B., Weintraub, C. E.

Journal:

Applied Physics Letters

Année:

2002

Langue:

english

Fichier:

PDF, 309 KB

english, 2002

29

Band offsets of atomic-layer-deposited Al[sub 2]O[sub 3] on GaAs and the effects of surface treatment

Nguyen, N. V., Kirillov, Oleg A., Jiang, W., Wang, Wenyong, Suehle, John S., Ye, P. D., Xuan, Y., Goel, N., Choi, K.-W., Tsai, Wilman, Sayan, S.

Journal:

Applied Physics Letters

Année:

2008

Langue:

english

Fichier:

PDF, 505 KB

english, 2008

30

Random telegraph signals in n-type ZnO nanowire field effect transistors at low temperature

Xiong, Hao D., Wang, Wenyong, Li, Qiliang, Richter, Curt A., Suehle, John S., Hong, Woong-Ki, Lee, Takhee, Fleetwood, Daniel M.

Journal:

Applied Physics Letters

Année:

2007

Langue:

english

Fichier:

PDF, 457 KB

english, 2007

31

[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Application of ALD High-k Dielectric Films as Charge Storage Layer and Blocking Oxide in Nonvolatile Memories

Zhu, Xiaoxiao, Gu, Diefeng, Li, Qiliang, Baumgart, Helmut, Ioannou, Dimitris, Suehle, John, Richter, Curt

Année:

2009

Langue:

english

Fichier:

PDF, 702 KB

english, 2009

32

Micromachined convective accelerometers in standard integrated circuits technology

Milanović, Veljko, Bowen, Edwin, Zaghloul, Mona E., Tea, Nim H., Suehle, John S., Payne, Beverly, Gaitan, Michael

Journal:

Applied Physics Letters

Année:

2000

Langue:

english

Fichier:

PDF, 358 KB

english, 2000

33

[IEEE 2008 8th IEEE Conference on Nanotechnology (NANO) - Arlington, Texas, USA (2008.08.18-2008.08.21)] 2008 8th IEEE Conference on Nanotechnology - Design, Fabrication and Characterization of High-Performance Silicon Nanowire Transistor

Li, Qiliang, Zhu, Xiaoxiao, Yang, Yang, Ioannou, Dimitris E., Xiong, Hao D., Suehle, John S., Richter, Curt A.

Année:

2008

Langue:

english

Fichier:

PDF, 620 KB

english, 2008

34

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Silicon nanowire memory application using hafnium oxide charge storage layer

Xiaoxiao Zhu,, Qiliang Li,, Ioannou, Dimitris E., Kimes, William A, Suehle, John S., Maslar, James E., Xiong, Hao D., Shuo Yang,, Richter, Curt A.

Année:

2007

Langue:

english

Fichier:

PDF, 423 KB

english, 2007

35

0.5 V Supply Voltage Operation of In0.65Ga0.35As/GaAs0.4Sb0.6 Tunnel FET

Rajamohanan, Bijesh, Pandey, Rahul, Chobpattana, Varistha, Vaz, Canute, Gundlach, David, Cheung, Kin P., Suehle, John, Stemmer, Susanne, Datta, Suman

Journal:

IEEE Electron Device Letters

Année:

2015

Langue:

english

Fichier:

PDF, 990 KB

english, 2015

36

Unexpected Effect of Thermal Storage Observed on SiC Power DMOSFET

Chbili, Zakariae, Shreshta, Pragya R., Campbell, Jason P., Suehle, John S., Ioannou, Dimitris E., Cheung, Kin P.

Journal:

Materials Science Forum

Année:

2014

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2014

37

Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices

Yu, Liang Chun, Cheung, Kin P., Dunne, Greg, Matocha, Kevin, Suehle, John S., Sheng, Kuang

Journal:

Materials Science Forum

Année:

2010

Langue:

english

Fichier:

PDF, 354 KB

english, 2010

38

Channel Hot-Carrier Effect of 4H-SiC MOSFET

Yu, Liang Chun, Cheung, Kin P., Suehle, John S., Campbell, Jason P., Sheng, Kuang, Lelis, Aivars J., Ryu, Sei Hyung

Journal:

Materials Science Forum

Année:

2009

Langue:

english

Fichier:

PDF, 479 KB

english, 2009

39

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - The Challenge of Measuring Defects in Nanoscale Dielectrics

Cheung, Kin P., Suehle, John S.

Année:

2008

Langue:

english

Fichier:

PDF, 382 KB

english, 2008

40

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Combinatorial Methodology for the Exploration of Metal Gate Electrodes on HfO2 for the Advanced Gate Stack

Chang, Kao-Shuo, Green, Martin, Suehle, John S., Hattrick-Simpers, Jason, Takeuchi, Ichiro, Ohmori, Kenji, Chikyow, T., De Gendt, Stefan, Majhi, Prashant

Année:

2008

Langue:

english

Fichier:

PDF, 914 KB

english, 2008

41

Wafer-Level Hall Measurement on SiC MOSFET

Yu, Liang Chun, Cheung, Kin P., Tilak, Vinayak, Dunne, Greg, Matocha, Kevin, Campbell, Jason, Suehle, John S., Sheng, Kuang

Journal:

Materials Science Forum

Année:

2010

Langue:

english

Fichier:

PDF, 345 KB

english, 2010

42

Silicon Nanowire Electromechanical Switch for Logic Device Application

Li, Qiliang, Koo, Sang-Mo, Edelstein, Monica D., Suehle, John S., Richter, Curt A.

Journal:

MRS Proceedings

Année:

2007

Langue:

english

Fichier:

PDF, 930 KB

english, 2007

43

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Work Function Characterization of TaSiN and TaCN Electrodes Using CV, IV, IPE and SKPM

Xiong, Hao, Nguyen, Nhan, Kopanski, Joshep, Suehl, John, Vogel, Eric

Année:

2006

Langue:

english

Fichier:

PDF, 384 KB

english, 2006

44

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

Li, Qiliang, Koo, Sang-Mo, Xiong, Hao D., Edelstein, Monica D., Suehle, John S., Zhu, Xiaoxiao, Ioannou, Dimitris E., Richter, Curt A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C

Année:

2007

Langue:

english

Fichier:

PDF, 1.76 MB

english, 2007

45

Nanometre gaps in gold wires are formed by thermal migration

Ramachandran, Ganesh K, Edelstein, Monica D, Blackburn, David L, Suehle, John S, Vogel, Eric M, Richter, Curt A

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 352 KB

english, 2005

46

Foreword Special Section on the 60th Anniversary of the International Electron Device Meeting

Suehle, John S.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1013 KB

english, 2015

47

Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Nonvolatile Memory Applications

Zhu, Hao, Pookpanratana, Sujitra J., Bonevich, John E., Natoli, Sean N., Hacker, Christina A., Ren, Tong, Suehle, John S., Richter, Curt A., Li, Qiliang

Journal:

ACS Applied Materials & Interfaces

Année:

2015

Langue:

english

Fichier:

PDF, 3.62 MB

english, 2015

48

SPIE Proceedings [SPIE Photonics East '99 - Boston, MA (Sunday 19 September 1999)] Chemical Microsensors and Applications II - Microhotplate gas sensor arrays

Cavicchi, Richard E., Semancik, Stephen, Walton, Robin M., Panchapakesan, Balaji, DeVoe, Don L., Aquino-Class, Maria I., Allen, James D., Suehle, John S., Buettgenbach, Stephanus

Année:

1999

Langue:

english

Fichier:

PDF, 4.69 MB

english, 1999

49

Frequency-Modulated Charge Pumping: Defect Measurements With High Gate Leakage

Ryan, Jason Thomas, Southwick, Richard G., Campbell, Jason Paul, Cheung, Kin P., Oates, Anthony S., Suehle, John S.

Journal:

IEEE Electron Device Letters

Année:

2014

Langue:

english

Fichier:

PDF, 441 KB

english, 2014

50

Noise in ZnO Nanowire Field Effect Transistors

Xiong, Hao D., Wang, Wenyong, Suehle, John S., Richter, Curt A., Hong, Woong-Ki, Lee, Takhee

Journal:

Journal of Nanoscience and Nanotechnology

Année:

2009

Langue:

english

Fichier:

PDF, 217 KB

english, 2009